Recent Computer Application to Dielectric Measurement

Application of Scanning Nonlinear Dielectric Microscopy to Measurement of Dopant Profiles in Transistors

This paper presents results obtained when using scanning nonlinear dielectric microscopy (SNDM) to measure dopant profiles in transistors. Secondary ion mass spectrometry (SIMS) measurements of an epitaxial multilayer film on a standard sample and SNDM measurements of the sample surface showed that it was possible to obtain a uniform concentration region with a thickness of approximately 4–5 μm...

Recent advances in planar optics: from plasmonic to dielectric metasurfaces

PATRICE GENEVET, FEDERICO CAPASSO,* FRANCESCO AIETA, MOHAMMADREZA KHORASANINEJAD, AND ROBERT DEVLIN Université Côte d’Azur, CNRS, CRHEA, rue Bernard Gregory, Sophia Antipolis 06560 Valbonne, France John A. Paulson School of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts 02138, USA Hewlett-Packard Laboratories, Palo Alto, California 94304, USA e-mail: Patrice.gene...

Measurement of Dielectric Material Properties

Microcontroller Based Dielectric Constant Measurement

A dielectric constant measurement setup has been developed to measure dielectric constant of liquids using AT89C55WD microcontroller. A modified operational amplifier based AC Schering Bridge network is used to compute capacitance and hence calculate dielectric constant of liquids. This instrument system permits recording of dielectric constant of liquids at various concentrations and temperatu...

Recent advances from application of doubly labeled water to measurement of human energy expenditure.

The doubly labeled water (DLW) method was developed 50 years ago, but nearly 40 years passed before it became a major tool for human nutrition research. Its use has grown dramatically, however, since the first human applications. The DLW method is now the preferred method for determining energy requirements of healthy and clinical populations. The method has been applied extensively to the stud...